Title :
E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products
Author :
Huang, Lily ; Smith, Michael ; Tran, Albert ; Miller, James
Author_Institution :
Univ. of Calgary, Calgary, AB
Abstract :
Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.
Keywords :
embedded systems; program diagnostics; program testing; shared memory systems; storage management; E-RACE; data race analysis; data-race identification tool; embedded products; embedded systems; embedded unit testing driven development framework; hardware-assisted approach; lockset-based data race detection; software code instrumentation; Data analysis; Hardware; Information analysis; Instruments; Monitoring; Registers; Software testing; Software tools; Watches; Yarn; embedded Agile development; hardware assisted code instrumentation; lockset–based data race detection; test driven development;
Conference_Titel :
Software Reliability Engineering, 2008. ISSRE 2008. 19th International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-0-7695-3405-3
Electronic_ISBN :
1071-9458
DOI :
10.1109/ISSRE.2008.23
