DocumentCode
1728076
Title
Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator
Author
Nand, Nitin R. ; Hartnett, John G.
Author_Institution
Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
fYear
2010
Firstpage
670
Lastpage
673
Abstract
A previously implemented cryogenic sapphire oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 × 10-16 at 20 s, a long-term frequency drift less than 1 × 10-14/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.
Keywords
cryogenic electronics; microwave oscillators; phase noise; sapphire; Allan deviation; CSO; VLBI site; cryogenic sapphire oscillator; frequency stability; hydrogen maser; improved X-band cryocooled sapphire oscillator; liquid helium cooled CSO; single sideband phase noise measurement; Cryogenics; Frequency measurement; Helium; Phase noise; Stability criteria; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location
Newport Beach, CA
ISSN
1075-6787
Print_ISBN
978-1-4244-6399-2
Type
conf
DOI
10.1109/FREQ.2010.5556243
Filename
5556243
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