DocumentCode :
1728282
Title :
Acoustic measurement techniques for bulk charge distribution in dielectrics irradiated by electron beam
Author :
Tanaka, Y. ; Fukuyoshi, F. ; Osawa, N. ; Miyake, H. ; Takada, T. ; Watanabe, R. ; Tomita, N.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
Volume :
2
fYear :
2004
Firstpage :
940
Abstract :
Bulk charge accumulation in dielectric materials under electron beam irradiation was observed using acoustic measurement techniques. Recently, some accidents in spacecraft due to the charging up of electric potential have been reported. Some of them are caused by surface discharge normally happens in plasma environment. Some others seem to be caused by discharge due to an accumulation of charge in bulk of materials in relatively higher altitude environment. Surface charge is usually measured using surface potential meter. However, there had been no useful method to measure the bulk charge in the materials. Therefore, we have been developing the bulk charge measurement system. The developed system is applicable to measure the charge distribution in dielectrics in vacuum environment under electron beam irradiation. Using the systems, we carried out the measurements of bulk charge distributions in Kapton® film and glass materials under electron beam irradiation. In this paper, summary of some typical measurement results is introduced following the brief explanation of measurement principles.
Keywords :
acoustic measurement; charge measurement; dielectric materials; electron beam effects; glass; limited space charge accumulation; surface charging; surface discharges; surface potential; thin films; Kapton film; acoustic measurement techniques; bulk charge accumulation; bulk charge distribution; bulk charge measurement system; dielectric materials; electric potential; electron beam irradiation; glass materials; plasma environment; surface discharge; surface potential; vacuum environment; Accidents; Acoustic measurements; Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Electron beams; Plasma measurements; Surface charging; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350586
Filename :
1350586
Link To Document :
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