DocumentCode
1728351
Title
Benchmarking NaI(TI) electron energy resolution measurements
Author
Mengesha, W. ; Valentine, J.D.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
Volume
2
fYear
2001
Firstpage
971
Abstract
NaI(Tl) electron energy resolution ηe determined for electron energies ranging from 16 keV to 437 keV was validated. The Compton coincidence technique (CCT) previously used for characterization of scintillator light yield nonproportionality, was slightly modified for use in the present study. Measured ηe, values range from 24% at 16 keV to 6.7% at 437 keV. ηe values determined represent variations in: light production from monoenergetic electrons (including effects due to light yield nonproportionality), light collection at the photomultiplier tube (PMT) photocathode, photoelectron production, photoelectron collection at the first dynode, and PMT gain, as well as noise from the accompanying electronics. To verify the accuracy of the MCCT-measured ηe, values, the total gamma-ray energy resolution ηe, was calculated based on Monte Carlo simulations, a simplified cascade sequence, and ηe. The resulting calculated ηγ values are then compared with measured ηγ values. Agreement to within 5% was observed for Eγ > 40 keV between the calculated and measured ηγ results. However, a discrepancy was observed between the calculated and measured values for Eγ < 40 keV. Results from this study provide insight into the significance of light yield nonproportionality and its contribution to energy resolution.
Keywords
Monte Carlo methods; coincidence techniques; electron detection; photoluminescence; photomultipliers; scintillation; solid scintillation detectors; 16 keV; 437 keV; Compton coincidence technique; Monte Carlo simulation; NaI(Tl); NaI:Tl; electron energy resolution; gain; gamma-ray energy resolution; photoelectron production; photomultiplier tube; scintillator light yield nonproportionality; Electrons; Energy measurement; Energy resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-7324-3
Type
conf
DOI
10.1109/NSSMIC.2001.1009716
Filename
1009716
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