• DocumentCode
    1728374
  • Title

    Kinetically controlled assembly of terpheny-4,4”-dithiol self-assembled monolayers (SAMs) for highly conductive anisotropically conductive adhesives (ACA)

  • Author

    Agar, Joshua C. ; Durden, Jessica ; Zhang, Rongwei ; Staiculescu, Daniela ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • Firstpage
    661
  • Lastpage
    666
  • Abstract
    Anisotropically conductive adhesives (ACA) are a promising alternative to solder interconnects for high performance electronic devices due to their increased I/O capabilities and reduced form factor. Previous studies have shown that modification of Au coated Ni/Cu bumps with conjugated self-assembly monolayers (SAMs) increases conductivity, current carrying capacity and reliability of ACA interconnects[1-3]. In this study, we kinetically control the assembly of p-Terphenyl-4,4”-dithiol (TPD) monolayers on Au bumps. Using a custom designed test vehicle we show how TPD SAMs can either increase or decrease the single bump resistance depending on the kinetics of the monolayer formation and its resulting structure. Future studies focusing on controlling monolayer assembly will determine the efficacy of conjugated SAMs at enhancing the conductivity and current carrying capacity of ACA interconnects.
  • Keywords
    conductive adhesives; copper alloys; integrated circuit interconnections; integrated circuit reliability; monolayers; nickel alloys; organic compounds; self-assembly; silver alloys; solders; Ag-Ni-Cu; Au coated Ni/Cu bumps; I/O capability; anisotropically conductive adhesives; bump resistance; kinetically controlled assembly; reliability; self-assembled monolayers; solder interconnects; terpheny-4,4”-dithiol; Assembly; Integrated circuit interconnections; Resistance; Rough surfaces; Surface roughness; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898584
  • Filename
    5898584