Title :
Measurement and modeling of charge profiles in irradiated dielectrics
Author :
Inguimbert, C. ; Carrere, Y. ; Griseri, V. ; Dirassen, B. ; Levy, L. ; Payan, Denis ; Fukunaga, K.
Author_Institution :
Office Nat. d´´Etudes et de Recherche Aerospatiales, Toulouse, France
Abstract :
In order to get a better understanding on the discharge initiation principle, a charge implantation analysis in electron irradiated dielectrics is proposed. Charge depth profiles measured by using the pulse electro acoustic (PEA) method are compared with numerical simulation.
Keywords :
charge measurement; dielectric materials; electron beam effects; pulsed electroacoustic methods; charge depth profiles; charge implantation analysis; charge profiles; electron irradiated dielectrics; pulse electro acoustic method; Acoustic pulses; Charge measurement; Current measurement; Dielectric measurements; Electron beams; Extraterrestrial measurements; Numerical simulation; Pulse measurements; Satellites; Space charge;
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
DOI :
10.1109/ICSD.2004.1350589
