DocumentCode
1728766
Title
Work In Progress: Reliability Test Facility
Author
Swain, Charles L.
Author_Institution
Electr. Eng. Technol., Rochester Inst. of Technol., NY
fYear
2006
Firstpage
12
Lastpage
13
Abstract
At the Rochester Institute of Technology students take courses in automated data acquisition, electronics packaging, and failure analysis and reliability. There are also facilities to do reliability testing on printed circuit board assemblies under variable conditions. It is planned to incorporate the reliability test facility into a real-world problem solving experience for the students that combines aspects from the three course areas mentioned. Students are involved in the design of the testing procedures, working with the data acquisition package that allows the data to be acquired, and analysis of the data to determine reliability. This paper presents the test facility and processes used for the products being tested, the data acquisition hardware and software used, and plans to implement this into the undergraduate curriculum
Keywords
data acquisition; educational courses; electronic engineering education; electronics packaging; failure analysis; printed circuit testing; reliability; automated data acquisition; data acquisition hardware; data acquisition software; data analysis; electronics packaging; failure analysis; printed circuit board assembly; product testing; reliability test facility; reliability testing; Assembly; Circuit testing; Data acquisition; Data analysis; Electronics packaging; Failure analysis; Printed circuits; Problem-solving; Software testing; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Frontiers in Education Conference, 36th Annual
Conference_Location
San Diego, CA
ISSN
0190-5848
Print_ISBN
1-4244-0256-5
Electronic_ISBN
0190-5848
Type
conf
DOI
10.1109/FIE.2006.322668
Filename
4117108
Link To Document