DocumentCode :
1728807
Title :
Wet chemical etching mechanism of silicon
Author :
Elwenspoek, M. ; Lindberg, U. ; Kok, H. ; Smith, L.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fYear :
1994
fDate :
6/16/1905 12:00:00 AM
Firstpage :
223
Lastpage :
228
Abstract :
We review what can be said on wet chemical etching of single crystals from the viewpoint of the science of crystal growth. Starting point is that there are smooth and rough crystal surfaces. The kinetics of smooth faces is controlled by a nucleation barrier that is absent on rough faces. The latter therefore etch faster by orders of magnitude. The analysis of the diamond crystal structure reveals that the {111} face is the only smooth face in this lattice-other faces might be smooth only because of surface reconstruction. In this way we explain the minimum of the etch rate in KOH:H2O in the <001> direction. Two critical predictions concerning the shape of the minimum of the etch rate close to <001> and the transition from isotropic to anisotropic etching in HF:HNO3 based solutions are tested experimentally. The results are in-agreement with the theory
Keywords :
etching; <001> direction; HF-HNO3; KOH-H2O; anisotropic etching; diamond crystal structure; etch rate; kinetics; nucleation barrier; rough crystal surfaces; smooth crystal surfaces; wet chemical etching; {111} face; Anisotropic magnetoresistance; Chemicals; Crystals; Kinetic theory; Rough surfaces; Shape; Silicon; Surface reconstruction; Surface roughness; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
Conference_Location :
Oiso
Print_ISBN :
0-7803-1833-1
Type :
conf
DOI :
10.1109/MEMSYS.1994.555627
Filename :
555627
Link To Document :
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