• DocumentCode
    1728807
  • Title

    Wet chemical etching mechanism of silicon

  • Author

    Elwenspoek, M. ; Lindberg, U. ; Kok, H. ; Smith, L.

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • fYear
    1994
  • fDate
    6/16/1905 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    228
  • Abstract
    We review what can be said on wet chemical etching of single crystals from the viewpoint of the science of crystal growth. Starting point is that there are smooth and rough crystal surfaces. The kinetics of smooth faces is controlled by a nucleation barrier that is absent on rough faces. The latter therefore etch faster by orders of magnitude. The analysis of the diamond crystal structure reveals that the {111} face is the only smooth face in this lattice-other faces might be smooth only because of surface reconstruction. In this way we explain the minimum of the etch rate in KOH:H2O in the <001> direction. Two critical predictions concerning the shape of the minimum of the etch rate close to <001> and the transition from isotropic to anisotropic etching in HF:HNO3 based solutions are tested experimentally. The results are in-agreement with the theory
  • Keywords
    etching; <001> direction; HF-HNO3; KOH-H2O; anisotropic etching; diamond crystal structure; etch rate; kinetics; nucleation barrier; rough crystal surfaces; smooth crystal surfaces; wet chemical etching; {111} face; Anisotropic magnetoresistance; Chemicals; Crystals; Kinetic theory; Rough surfaces; Shape; Silicon; Surface reconstruction; Surface roughness; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
  • Conference_Location
    Oiso
  • Print_ISBN
    0-7803-1833-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1994.555627
  • Filename
    555627