• DocumentCode
    1728849
  • Title

    Simulation of open and shorted RC interconnect waveforms for voltage step function with low and high transient response

  • Author

    El-Shennawy, Khamies M.

  • Author_Institution
    Acad. for Sci. & Technol. & Maritime Transp., Alexandria, Egypt
  • Volume
    2
  • fYear
    1997
  • Firstpage
    767
  • Abstract
    This paper presents the interconnect analysis of the BICMOS and ECL gates, modeled by uniformly distributed Resistance-Capacitance along the wire network for node step voltage. Open and shorted ended responses are analysed. The current and voltage are plotted for lows and high transient time τ=0.0 up to 5. Two Laplace transformations, contour integration, Heaviside theorem, and bisection technique algorithms, are used. The results show that for τ less than 0.1 the responses oscillate around the interconnect length axis having positive and negative values while for τ higher than 0.1 the response is totally positive which is very important criterion during design techniques
  • Keywords
    BiCMOS digital integrated circuits; BiCMOS logic circuits; Laplace transforms; circuit analysis computing; distributed parameter networks; emitter-coupled logic; integrated circuit interconnections; integration; logic gates; transient analysis; transient response; transmission line theory; BICMOS gates; ECL gates; Heaviside theorem; Laplace transformations; bisection technique algorithms; contour integration; high transient response; interconnect analysis; low transient response; open RC interconnect waveforms; shorted RC interconnect waveforms; uniformly distributed resistance-capacitance; voltage step function; Analytical models; BiCMOS integrated circuits; Boundary conditions; Circuit simulation; Electronics industry; Integrated circuit interconnections; Laplace equations; Transient response; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1997. Proceedings., 1997 21st International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-3664-X
  • Type

    conf

  • DOI
    10.1109/ICMEL.1997.632958
  • Filename
    632958