DocumentCode :
1728866
Title :
Observation of the acoustoelectric effect in gallium nitride micromechanical bulk acoustic filters
Author :
Gokhale, Vikrant J. ; Shim, Yonghyun ; Rais-Zadeh, Mina
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2010
Firstpage :
524
Lastpage :
529
Abstract :
We report on the experimental verification of the acoustoelectric effect in gallium nitride (GaN) and present a model to describe this effect in GaN thickness-mode bulk acoustic filters. Filters are fabricated using 2.2 μm thick n-type GaN on high resistivity silicon epiwafers obtained from SOITEC. Acoustoelectric effect was observed by applying an electric field parallel to c-axis, the direction of acoustic wave propagation. Improvement in the insertion loss and out-of-band rejection was observed and Q amplifications exceeding 240% was achieved. Acoustoelectric effect makes it possible to dynamically tune the frequency response of GaN resonators and filters.
Keywords :
acoustic filters; acoustic resonators; acoustic wave propagation; acoustoelectric effects; bulk acoustic wave devices; frequency response; gallium compounds; micromechanical devices; GaN; GaN thickness-mode bulk acoustic filters; Q amplifications; SOITEC; acoustic wave propagation; acoustoelectric effect experimental verification; electric field; frequency response; gallium nitride micromechanical bulk acoustic filters; high resistivity silicon epiwafers; insertion loss; out-of-band rejection; size 2.2 mum; thick n-type GaN filters; Acoustoelectric effects; Electrodes; Gallium nitride; Resonator filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location :
Newport Beach, CA
ISSN :
1075-6787
Print_ISBN :
978-1-4244-6399-2
Type :
conf
DOI :
10.1109/FREQ.2010.5556273
Filename :
5556273
Link To Document :
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