Title :
Measurements of light fields emerging from fine amplitude gratings
Author :
Kim, Myun-Sik ; Scharf, Toralf ; Herzig, Hans-Peter
Author_Institution :
Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
Abstract :
High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.
Keywords :
Talbot effect; diffraction gratings; Talbot effect; diffraction orders; fine amplitude gratings; light field measurements; periodicity; Diffraction; Diffraction gratings; Gratings; Image resolution; Optical interferometry; Phase measurement; Wavelength measurement;
Conference_Titel :
Optical MEMS and Nanophotonics (OPT MEMS), 2010 International Conference on
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-8926-8
Electronic_ISBN :
978-1-4244-8925-1
DOI :
10.1109/OMEMS.2010.5672135
