DocumentCode
1729214
Title
Numerical analysis of a novel MTJ stack for high readability and writability
Author
Raychowdhury, A. ; Augustine, C. ; Somasekhar, D. ; Tschanz, J. ; Roy, K. ; De, V.
Author_Institution
Circuit Res. Lab., Intel Corp., Hillsboro, OR, USA
fYear
2011
Firstpage
347
Lastpage
350
Abstract
A novel MTJ stack employing a bidirectional switching mechanism has been proposed. By using a pulsed bidirection current, an MTJ with a SAF free layer and AP fixed layers can be switched through a metastable ferromagnetic state. Numerical simulations suggest high readability (like single barrier structures) and writability (like double barrier structures) of the proposed device.
Keywords
ferromagnetic materials; magnetic tunnelling; numerical analysis; random-access storage; AP fixed layer; MTJ stack; SAF free layer; bidirectional switching mechanism; magnetic tunneling junction stack; metastable ferromagnetic state; numerical analysis; pulsed bidirection current; readability; spin torque transfer RAM cell; synth antiferomagnetic free layer; writability; Current density; Magnetic tunneling; Magnetization; Switches; Switching circuits; Torque; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
Conference_Location
Helsinki
ISSN
1930-8876
Print_ISBN
978-1-4577-0707-0
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2011.6044163
Filename
6044163
Link To Document