• DocumentCode
    1729256
  • Title

    Automated analysis of timing faults in synchronous MOS circuits

  • Author

    Vanden Meersch, E. ; Claesen, L. ; De Man, H.

  • Author_Institution
    Interuniv. Micro Electron. Center, Leuven, Belgium
  • fYear
    1988
  • Firstpage
    487
  • Abstract
    The application of the SLOCOP timing verifier, which uses a rule-based subcircuit partitioning, is considered. The rule-based method is used to transform the network of MOS transistors, obtained from the physical layout by extraction into a network of unidirectional subcircuits. Each subcircuit is characterized by a logic model, which is used to accurately derive the timing constraints. The timing model of the circuit, required by this algorithm, is derived from the created subcircuit structure. The logic model makes it possible to eliminate false edges in the signal propagation graph. The resulting timing verifier can be used for a wide range of static and dynamic nMOS and CMOS circuits.<>
  • Keywords
    MOS integrated circuits; clocks; integrated logic circuits; logic testing; CMOS; SLOCOP timing verifier; extraction; false edges; nMOS; physical layout; rule-based subcircuit partitioning; signal propagation graph; synchronous MOS circuits; timing constraints; timing faults; timing model; unidirectional subcircuits; Circuit analysis; Circuit faults; Circuit simulation; Clocks; Delay; Latches; Logic; MOSFETs; Semiconductor device modeling; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1988., IEEE International Symposium on
  • Conference_Location
    Espoo, Finland
  • Type

    conf

  • DOI
    10.1109/ISCAS.1988.14970
  • Filename
    14970