Title :
Method of Creating Database for Test System Based on MCU
Author :
Buyue, Chen ; Yinkun, Wang ; Jin, Zhang
Author_Institution :
NDRC, Beijing
Abstract :
In this paper the method of creating database for test system based on MCU was introduced. Firstly, a database which could save the data transmitted through the serial bus connecting PC with a test system based on MCU, was created on PC. Then a serving application on PC was programmed with the technologies of serial interface and ODBC. When the test system based on MCU sends data in NEMA message format to PC through serial bus, the application on PC receives the test data and connects the background database to save them timely. Such a method of creating database for storing test data is simple and practicable, making the test data captured in test system based on MCU be stored, handled and checked in data tables of the database on PC. The method provides an effective way to configure network test system.
Keywords :
automatic test equipment; database management systems; MCU; NEMA message format; ODBC; network test system; open database connectivity; serial bus; serial bus connection; test data storage; test system database; Chromium; Data processing; Driver circuits; Electronic equipment testing; Instruments; Joining processes; Missiles; Standards development; System testing; Visual databases; MCU; NEMA; ODBC; database; serial bus; test system;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350905
