DocumentCode :
1729377
Title :
Thin gold to gold bonding for flip chip applications
Author :
Rohwer, Lauren E S ; Chu, Dahwey
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2011
Firstpage :
907
Lastpage :
910
Abstract :
We have demonstrated a solderless flip chip bonding process that utilizes electroless nickel/palladium, immersion gold pad metallization. This mask-less process enables higher interconnect densities than can be achieved with standard solder bump reflow. The thin (100nm) immersion gold surfaces were coated with dodecanethiol self-assembled monolayers. Strong gold to gold bonds were formed at 185°C with shear strengths that exceed Mil-Std 883 requirements. Gold stud bumps are also promising for flip chip applications, and can be bonded at 150°C when the gold surfaces are properly pre-treated - dilute piranha solution, argon plasma, and dodecanethiol SAM treatments work equally well.
Keywords :
flip-chip devices; gold; lead bonding; metallisation; monolayers; nickel alloys; palladium alloys; reflow soldering; self-assembly; Au; Ni-Pd; argon plasma; dilute piranha solution; dodecanethiol SAM treatments; dodecanethiol self-assembled monolayers; gold stud bumps; immersion gold pad metallization; maskless process; solder bump reflow; solderless flip chip bonding process; temperature 150 degC; temperature 185 degC; thermosonic gold wire bonding; Arrays; Bonding; Flip chip; Gold; Plasmas; Surface treatment; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898619
Filename :
5898619
Link To Document :
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