Title :
Burst and latency requirements drive EDO and BEDO DRAM standards
Author_Institution :
Micron Technol. Inc., Santa Clara, CA, USA
Abstract :
The standard "commodity" DRAM functionality has recently evolved from fast page mode (FPM) into extended data out (EDO) and burst extended data out (BEDO). These functional changes are the response to the need for improved burst rates with low lead-off latencies. EDO and BEDO meet these requirements and retain the same low manufacturing cost.
Keywords :
DRAM chips; standards; BEDO; DRAM standards; EDO; burst extended data out; burst requirements; extended data out; fast page mode; latency requirements; Computer architecture; Costs; Delay; Error correction codes; Frequency; High performance computing; Lead; Manufacturing; Microprocessors; Random access memory;
Conference_Titel :
Compcon '96. 'Technologies for the Information Superhighway' Digest of Papers
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-7414-8
DOI :
10.1109/CMPCON.1996.501795
