• DocumentCode
    1729465
  • Title

    Nondestructive evaluation by permeance testing

  • Author

    Smith, E.D. ; Hancke, G.P. ; Smit, P.C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Pretoria Univ., South Africa
  • fYear
    1997
  • Firstpage
    983
  • Abstract
    An AC permeance tester for the evaluation of defects in ferritic materials is examined. The permeance tester, having similar characteristics to a linear variable differential transformer (LVDT), is sensitive to variations in permeance. An E-type magnetic transformer core is used to produce a varying flux on its central limb with two pickup coils on the outer limbs. The voltages appearing across the pickup coils are connected in opposition and the difference voltage measured by a voltmeter. An analytical model is developed showing that the normalized difference voltage is directly related to the volume of any small defect in a ferritic sample which intercepts the flux between the limbs. Calculated theoretical defect size compares favourably with that measured by a prototype permeance tester. Measurement by the permeance tester offers the following: (a) a relatively simple, though approximate analytical relationship between the defect size and the indication given by the tester; and (b) the sensitivity of a permeance tester is of the same order of magnitude as the core-less eddy current tester
  • Keywords
    coils; magnetic flux; nondestructive testing; transformer cores; transformers; voltage measurement; AC permeance tester; E-type magnetic transformer core; defects evaluation; difference voltage measurement; ferritic materials; linear variable differential transformer; nondestructive evaluation; outer limbs; pickup coils; sensitivity; varying flux production; voltmeter; Coils; Eddy current testing; Magnetic flux; Magnetic materials; Materials testing; Nondestructive testing; Size measurement; Transformer cores; Voltage measurement; Voltmeters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 1997. ISIE '97., Proceedings of the IEEE International Symposium on
  • Conference_Location
    Guimaraes
  • Print_ISBN
    0-7803-3936-3
  • Type

    conf

  • DOI
    10.1109/ISIE.1997.648863
  • Filename
    648863