Title : 
Modeling of failure mechanisms for optimized MEMS CAD: design, fabrication and characterization of in situ test benches
         
        
            Author : 
Millet, O. ; Agache, V. ; Legrand, B. ; Collard, D. ; Buchaillot, L.
         
        
            Author_Institution : 
Inst. d´Electron. de Micro-electron. et de Nanotechnol., CNRS, Villeneuve d´Ascq, France
         
        
        
        
        
            Abstract : 
This work considers the reliability of surface microfabricated structures and particularly the dynamic response of structural layers during operations, in order to develop a statistical modelling of failure mechanisms for micro-actuator. In situ test benches have been designed and fabricated allowing to applied elementary solicitations (traction, bending and torsion) to representative samples. Gold, in situ doped polysilicon and polysilicon doped by diffusion are used as structural layers. These devices are useful to study the fatigue phenomenon. Characterization and fatigue tests have been performed in a vacuum chamber under different environmental and stimuli conditions. Moreover, a theoretical analysis using Finite Elements Method has been achieved.
         
        
            Keywords : 
CAD; bending; diffusion; elemental semiconductors; failure analysis; fatigue; finite element analysis; gold; mechanical testing; microactuators; reliability; silicon; torsion; traction; MEMS CAD; Si:Au; bending; diffusion; elementary solicitations; failure mechanisms; fatigue tests; finite elements method; gold; microactuator; polysilicon; reliability; surface microfabricated structures; torsion; traction; Design automation; Design optimization; Fabrication; Failure analysis; Fatigue; Gold; Microactuators; Micromechanical devices; Performance evaluation; Testing;
         
        
        
        
            Conference_Titel : 
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
         
        
            Conference_Location : 
Boston, MA, USA
         
        
            Print_ISBN : 
0-7803-7731-1
         
        
        
            DOI : 
10.1109/SENSOR.2003.1217081