• DocumentCode
    1729710
  • Title

    Mode shape measurement system with temperature variation function

  • Author

    Ishii, T. ; Watanabe, Y. ; Yano, Y. ; Goka, S. ; Sato, T. ; Sekimoto, H.

  • Author_Institution
    Grad. Sch. of Sci. & Eng., Tokyo Metropolitan Univ., Tokyo, Japan
  • fYear
    2010
  • Firstpage
    384
  • Lastpage
    387
  • Abstract
    A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C.
  • Keywords
    crystal resonators; shape measurement; temperature control; AT-cut quartz resonator; frequency 5.6 MHz; intermittent device excitation; laser speckle method; mode shape measurement system; piezoelectric resonator devices; temperature 74 degC; temperature control function; temperature variation function; vibration patterns; Measurement by laser beam; Optical imaging; Optical resonators; Resonant frequency; Shape; Temperature measurement; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2010 IEEE International
  • Conference_Location
    Newport Beach, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-6399-2
  • Type

    conf

  • DOI
    10.1109/FREQ.2010.5556305
  • Filename
    5556305