DocumentCode
1729787
Title
Research of the Strategy for System Level Optimal Diagnosis Test Based on the Minimal Cut Sets of Fault Tree
Author
Youlin, An ; Kaoli, Huang ; Suochang, Yang
Author_Institution
Ordnance Eng. Coll., Shijiazhuang
fYear
2007
Abstract
This paper studied the minimal cut sets; the minimal cut sets importance and test cost based on the principle and approach of fault tree in application for fault optimal diagnosis & test. Firstly, the mathematical description of the minimal cut sets, the minimal cut sets importance and testing cost is given. Then, a strategy of diagnosis test based on the minimal cut sets importance and the minimal testing cost is put forward, and necessary condition of the optimal test sequence is also presented. Finally, the optimal approaches of the bottom events test sequence in the minimal cut sets are given. The results indicate that the strategy of diagnosis test based on the minimal cut sets importance and the minimal test cost of fault tree could more accurately solve the inconsistency between diagnosis hit rate and test cost, and could be an effective approach for studying to improve fault diagnosis efficiency, reduce test cost and optimize fault diagnosis test.
Keywords
cost reduction; fault diagnosis; fault trees; mathematical analysis; cost reduction; fault diagnosis efficiency; fault tree; minimal cut sets; optimal test sequence; system level optimal diagnosis test; Circuit faults; Circuit testing; Cost function; Electronic equipment testing; Fault diagnosis; Fault trees; Instruments; Logic testing; System testing; Tellurium; fault tree; test cost; test strategy; the minimal cut sets; the minimal cut sets importance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4350924
Filename
4350924
Link To Document