Title :
CW cathode development for LAPPS
Author :
Murphy, D.P. ; Leonhardt, D. ; Fernsler, R.F. ; Meger, R.A. ; Walton, S.G. ; Blackwell, D.D.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form given only, as follows. NRL is developing a Large Area Plasma Processing System (LAPPS) for materials processing applications. The plasma generation technique utilizes a sheet electron beam to ionize a low pressure, neutral background gas such as oxygen, nitrogen or argon at a pressure of 20-100 mTorr. The beam electrons are generated by a separate hollow-cathode diode located outside the processing region and confined to a narrow channel by a axial magnetic field of 100-300 Gauss. Plasma production is confined to the beam channel. A hollow-cathode which produces a 5 kV, 1 cm wide by 30 cm long continuous (CW) beam has been fielded and a 50 cm wide cathode is under design. Langmuir probe data indicates the plasma density within the plasma sheet is >2 × 10/sup 12/ cm/sup -3/ with T/sub e/ = 0.5 eV in a 50 mTorr oxygen background. Plasma density measurements inside and outside the beam region have been made in both oxygen and argon as a function of distance from the beam and are in agreement with a diffusion model. Plasma density and temperature measurements for various gases and cathode configurations will be presented.
Keywords :
Langmuir probes; cathodes; glow discharges; plasma density; plasma materials processing; plasma production; plasma temperature; 100 to 300 G; 20 to 100 mtorr; 30 cm; 5 kV; 50 cm; CW cathode; Langmuir probe data; Large Area Plasma Processing System; argon; hollow-cathode; materials processing applications; neutral background gas; nitrogen; oxygen; plasma density; plasma generation technique; plasma sheet; plasma temperature; sheet electron beam; Argon; Cathodes; Electron beams; Magnetic confinement; Particle beams; Plasma applications; Plasma confinement; Plasma density; Plasma materials processing; Plasma measurements;
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
DOI :
10.1109/PPPS.2001.960747