DocumentCode
1729964
Title
Design of Equipment Fault Injection System Based on BIT
Author
Qing, Chang ; Jianhui, Chen
Author_Institution
Ordnance Eng. Coll., Shijiazhuang
fYear
2007
Abstract
At present, the microprocessor technology and micro-electronics technology are developing fast. The complication of equipment electronic systems is improving continuously, so is the density of the circuits. Therefore, BIT (built-in test) has become a crucial element in solving fault diagnosis of equipment electronic systems. In order to design BIT effectively and evaluate its fault diagnosis ability, fault injection technology should be applied to the system to carry out the testability experiment. Aiming at the requirement of testability experiment for certain equipment, a fault injection system based on BIT is set up. The basic flow and theory about fault injection is expatiated on and the hardware frame of fault injection system is given.
Keywords
built-in self test; fault diagnosis; military equipment; weapons; BIT technique; built-in test; equipment fault injection system; fault diagnosis; microelectronics technology; microprocessor technology; military equipment; testability experiment; Aerospace control; Aerospace electronics; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Hardware; Instruments; Maintenance; System testing; built-in test; fault injection; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4350930
Filename
4350930
Link To Document