Title :
Design of Equipment Fault Injection System Based on BIT
Author :
Qing, Chang ; Jianhui, Chen
Author_Institution :
Ordnance Eng. Coll., Shijiazhuang
Abstract :
At present, the microprocessor technology and micro-electronics technology are developing fast. The complication of equipment electronic systems is improving continuously, so is the density of the circuits. Therefore, BIT (built-in test) has become a crucial element in solving fault diagnosis of equipment electronic systems. In order to design BIT effectively and evaluate its fault diagnosis ability, fault injection technology should be applied to the system to carry out the testability experiment. Aiming at the requirement of testability experiment for certain equipment, a fault injection system based on BIT is set up. The basic flow and theory about fault injection is expatiated on and the hardware frame of fault injection system is given.
Keywords :
built-in self test; fault diagnosis; military equipment; weapons; BIT technique; built-in test; equipment fault injection system; fault diagnosis; microelectronics technology; microprocessor technology; military equipment; testability experiment; Aerospace control; Aerospace electronics; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Hardware; Instruments; Maintenance; System testing; built-in test; fault injection; testability;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350930
