• DocumentCode
    1729991
  • Title

    GaN pitch-variable grating fabricated on Si substrate

  • Author

    Sameshima, H. ; Tanae, T. ; Hu, F. ; Hane, K.

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2010
  • Firstpage
    79
  • Lastpage
    80
  • Abstract
    A tunable grating is fabricated by micromachining a GaN crystal layer grown on Si substrate. The tunable grating consists of grating lines, electro-static comb-drive actuator and connection springs. The grating consists of 85nm wide, 12μm long 24 grating lines with 674nm period. The crystallization stress of an HfO2 layer deposited on the GaN crystal is used to compensate the residual stress of the GaN crystal grown on Si substrate. The freestanding GaN structure consisting of the grating and the actuator is fabricated by etching the Si substrate with XeF2 gas. Applying the voltage of 140V, the grating is expanded by 600nm corresponding to the period change of 3.7%.
  • Keywords
    III-V semiconductors; diffraction gratings; gallium compounds; hafnium compounds; integrated optics; internal stresses; micromachining; optical design techniques; optical fabrication; optical materials; optical tuning; silicon; wide band gap semiconductors; GaN; Si; XeF2; crystallization stress; electrostatic comb-drive actuator; etching; micromachining; pitch-variable grating; residual stress; voltage 140 V; Crystals; Etching; Gallium nitride; Gratings; Silicon; Substrates; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OPT MEMS), 2010 International Conference on
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-8926-8
  • Electronic_ISBN
    978-1-4244-8925-1
  • Type

    conf

  • DOI
    10.1109/OMEMS.2010.5672174
  • Filename
    5672174