• DocumentCode
    1730519
  • Title

    Silicon MEMS micro-switch with charge-induced retention

  • Author

    Suzuki, K. ; Neav, Y.

  • Author_Institution
    Fundamental Res. Labs., NEC Corp., Tsukuba, Japan
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1718
  • Abstract
    We report for the first time that a silicon MEMS micro-switch has successfully been operated in a manner of having a retention function, which is induced by a flow of stored charges. Depending on the maximum applied voltage, the micro-switches change the state of no bias voltage between ´Switch-on´ and ´Switch-off´ states. This change is reversible and repeatable. The retention function will enable a new type of MEMS micro-switch for mobile wireless terminals, offering low power consumption, simple circuit configuration, and long stability.
  • Keywords
    elemental semiconductors; microswitches; mobile communication; power consumption; silicon; charge-induced retention function; circuit configuration; mobile wireless terminals; power consumption; silicon MEMS microswitch; Contacts; Electrodes; Energy consumption; Etching; Glass; Microelectromechanical devices; Micromechanical devices; Microswitches; Silicon compounds; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1217116
  • Filename
    1217116