• DocumentCode
    1730537
  • Title

    A neural network approach for fault diagnosis of large-scale analogue circuits

  • Author

    He, Yi-Gang ; Tan, Yang-Hong ; Sun, Yichuang

  • Author_Institution
    Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Abstract
    An approach for fault diagnosis of large-scale analogue circuits using neural networks is presented in the paper. This method is based on the fault dictionary technique, but it can deal with soft faults due to the robustness of neural networks. Because the neural networks can create the fault dictionary, memorize and verify it simultaneously, computation time is drastically reduced. Rather than dealing with the whole circuit directly, the proposed approach partitions a large-scale circuit into several small sub-circuits and then tests each sub-circuit using the neural network method. The principle and diagnosis procedure of the method are described. Two examples are given to illustrate the method for both small and large-scale circuits.
  • Keywords
    analogue integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; neural nets; circuit partitioning; computation time reduction; fault diagnosis; fault dictionary technique; large-scale analogue circuits; neural networks; soft faults; Circuit faults; Circuit testing; Dictionaries; Electrical fault detection; Extraterrestrial measurements; Fault diagnosis; Large-scale systems; Mathematical model; Neural networks; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
  • Print_ISBN
    0-7803-7448-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2002.1009800
  • Filename
    1009800