DocumentCode :
1730539
Title :
Large-signal GaN HEMT electro-thermal model with 3D dynamic description of self-heating
Author :
Bernardoni, Mirko ; Delmonte, Nicola ; Sozzi, Giovanna ; Menozzi, Roberto
Author_Institution :
Dept. of Inf. Eng., Univ. of Parma, Parma, Italy
fYear :
2011
Firstpage :
171
Lastpage :
174
Abstract :
This paper shows a physical approach to large-signal electro-thermal simulation of AlGaN/GaN HEMTs. The dynamic thermal behavior of the HEMT is described by a 3D network of thermal resistances and capacitances describing the physical structure of the HEMT, and including features such as the thermal boundary resistance between GaN and SiC, and the die-attach, as well as temperature non-uniformity along the gate finger. The thermal network is self-consistently coupled inside ADS with an electro-thermal large-signal model.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; thermal resistance; wide band gap semiconductors; AlGaN-GaN; HEMT physical structure; die-attach; dynamic thermal property; electro-thermal large-signal model; gate finger; large-signal HEMT electro-thermal model; self-heating 3D dynamic description; thermal boundary resistance; thermal resistance 3D network; Fingers; Gallium nitride; HEMTs; Silicon carbide; Solid modeling; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
Conference_Location :
Helsinki
ISSN :
1930-8876
Print_ISBN :
978-1-4577-0707-0
Electronic_ISBN :
1930-8876
Type :
conf
DOI :
10.1109/ESSDERC.2011.6044207
Filename :
6044207
Link To Document :
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