DocumentCode :
1730585
Title :
Advanced MCM-Ls for consumer electronics
Author :
Amami, K. ; Yuhaku, Satom ; Shiraishi, Tukasa ; Bessho, Yoshihiro ; Eda, Kazuo ; Ishida, Tom
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear :
1998
Firstpage :
249
Lastpage :
254
Abstract :
We have developed an advanced MCM (multichip module) using the SBB/sup TM/ (stud-bump bonding) flip-chip technique on an ALIVH/sup TM/ (any layer inner via hole) structure substrate. The SBB technique is an advanced flip-chip bonding technique for high density MCM, which can mount bare LSI chips directly on substrates. The bonding portion structure is composed of Au bumps with two-stepped construction and conductive adhesives. The conductive adhesive is very flexible in bond, thus relaxing thermal and mechanical stresses. The ALIVH substrate is a high density and high performance multilayered printed wiring board with any layer inner via hole structure, CO/sub 2/ laser via hole processing technology and interconnection technology which employs conductive paste. We had good results for several reliability tests in the advanced MCM-L test vehicles. In particular, in the thermal shock test, the increase in connection resistance in the advanced MCM-Ls was smaller than that of MCM-Ls which used ordinary organic substrates instead of the ALIVH substrate. We manufactured a CCD camera module using these MCM-Ls. LSI chips were mounted on the six-layered ALIVH substrate. The MCM-Ls obtained was downsized (60% down) and lighter in weight (30% reduction) when compared with the conventional module, and the electrical characteristics of the newly manufactured CCD camera module were equal to those of the conventional module.
Keywords :
CCD image sensors; adhesives; cameras; conducting polymers; consumer electronics; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; internal stresses; laminates; laser beam machining; laser materials processing; multichip modules; stress relaxation; thermal shock; thermal stresses; ALIVH substrate; Au; Au bumps; CCD camera module; CO/sub 2/; CO/sub 2/ laser via hole processing technology; MCM-L downsizing; MCM-L test vehicles; MCM-L weight reduction; MCM-Ls; SBB flip-chip technique; any layer inner via hole structure; any layer inner via hole structure substrate; bare LSI chip mounting; bonding portion structure; conductive adhesives; conductive paste; connection resistance; consumer electronics; electrical characteristics; flexible conductive adhesive bond; interconnection technology; mechanical stress relaxation; multichip module; multilayered printed wiring board; organic substrates; reliability tests; stud-bump bonding flip-chip technique; thermal shock test; thermal stress relaxation; Bonding; Charge coupled devices; Charge-coupled image sensors; Conductive adhesives; Consumer electronics; Large scale integration; Manufacturing; Multichip modules; Testing; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEMT/IMC Symposium, 2nd 1998
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-5090-1
Type :
conf
DOI :
10.1109/IEMTIM.1998.704631
Filename :
704631
Link To Document :
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