DocumentCode :
1730660
Title :
3-dimensional memory module assembly technology
Author :
Kyouogku, Yoshitaka ; Yamaguti, Yukio ; Ohkubo, Kazuhiko
Author_Institution :
NEC Corp., Kawasaki, Japan
fYear :
1998
Firstpage :
272
Lastpage :
277
Abstract :
In order to meet the demand for higher density and greater capacity, a three dimensional memory module has been developed. NEC has developed a new type of 3D memory module which uses single memory module stacking technology. It satisfies the demands for higher packaging density using a simple structure. The reliability of the single memory modules and 3D memory module was tested using 16 Mb DRAM chips. The results suggest that our 3D memory modules have good reliability. With our dual in-line memory modules (DIMM), no breaks in the solder bonds between single memory modules and motherboard were observed over 3000 cycles of thermal cycling testing.
Keywords :
DRAM chips; assembling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; multichip modules; soldering; thermal stresses; 16 Mbit; 3D memory module; 3D memory module assembly technology; DRAM chips; dual in-line memory modules; memory capacity; memory density; motherboard; packaging density; reliability; single memory module stacking technology; single memory modules; solder bonds; thermal cycling testing; Assembly; Bonding; Ceramics; Copper; Microelectronics; National electric code; Semiconductor device packaging; Stacking; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEMT/IMC Symposium, 2nd 1998
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-5090-1
Type :
conf
DOI :
10.1109/IEMTIM.1998.704634
Filename :
704634
Link To Document :
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