• DocumentCode
    1731098
  • Title

    Using Wavefront Coding in presence of non-symmetric aberrations

  • Author

    Lariviere-Bastien, M. ; Thibault, Samuel

  • Author_Institution
    Dept. de Phys., de Genie Phys. et d´Opt., Laval Univ., Quebec City, QC, Canada
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Wavefront coding is a hybrid technology designed to increase depth of field of conventional optics but it can also be used to compensate for other aberration and ease tolerancing. The goal of our research is to apply this technology to panoramic imager. Panoramic imagers suffer from an increase level of aberration due to the large field of view and it is also subject to a special tolerance process. They also typically have a wide variation of the point spread function (PSF) across the field of view and suffer from non-symmetric aberration like coma and astigmatism. To obtain the best result using wavefront coding, the PSF should be as invariant as possible over the whole field of view. Asymmetric phase masks, when used in systems having non-negligible asymmetric aberrations, generate variations in the final image quality. For that reason, a model that predicts the final image quality of wavefront coded system is needed. The possibility of using two surfaces for wavefront coding has been studied. The final results were analysed using a variance based image quality criterion. From these results, it is possible to optimize phase mask for panoramic imager and predict the resulting image quality.
  • Keywords
    aberrations; image coding; image sensors; masks; optical transfer function; PSF; astigmatism; asymmetric phase masks; coma; field of view; image quality; nonnegligible asymmetric aberrations; nonsymmetric aberrations; optimized phase mask; panoramic imager; point spread function; tolerance process; wavefront coding; Panomorph; Wavefront coding; wide angle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Optics (WIO), 2012 11th Euro-American Workshop on
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4673-2000-9
  • Electronic_ISBN
    978-1-4673-1998-0
  • Type

    conf

  • DOI
    10.1109/WIO.2012.6488906
  • Filename
    6488906