Title :
Simulation of obstacle avoidance system (OASYS) sensor and display alternatives
Author :
Hughes, J. Michael
Author_Institution :
CAE Electron. Ltd., St. Laurent, Que., Canada
Abstract :
The U.S. Army Crew Station Research and Development Facility (CSRDF) at NASA Ames Research Center recently completed an experiment whose goal was to analyze candidate symbologies for the display of information obtained from a simulated Obstacle Avoidance System (OASYS) Sensor. The OASYS Sensor, developed by Northrop Corporation in conjunction with BES Engineering Services and SPARTA, consists of a laser-radar (ladar) that pulses at a high rate. The ladar returns distances to objects encountered. These returns are then assembled to determine where (if any) objects are located with respect to the aircraft. Once detected, the objects are retained in internal memory for a period of time, so that the sensor maintains as exact a picture as possible of the world in front of and, in the case of a ship that is moving, around the ownship as well. These objects, taken as a whole, form what is known as the object database, which is used as input to a symbology generator. This paper will discuss the design and implementation of the real-time OASYS sensor model that were use in the aforementioned experiment
Keywords :
aerospace computing; aerospace simulation; aircraft instrumentation; digital simulation; display instrumentation; image processing equipment; military systems; optical radar; safety systems; satellite computers; visual databases; BES Engineering Services; NASA Ames Research Center; Northrop Corporation; OASYS coprocessor; SPARTA; U.S. Army; architecture; ladar; line graph symbology; object database; obstacle avoidance system; real-time display; simulation environment; symbology generator; Aerospace engineering; Analytical models; Assembly; Displays; Information analysis; Laser radar; NASA; Optical pulses; Research and development; Sensor systems;
Conference_Titel :
Digital Avionics Systems Conference, 1993. 12th DASC., AIAA/IEEE
Conference_Location :
Fort Worth, TX
Print_ISBN :
0-7803-1343-7
DOI :
10.1109/DASC.1993.283535