DocumentCode :
1731237
Title :
Incrementally etched electrical feedthroughs for wafer-level transfer of glass lid packages
Author :
Oberhammer, J. ; Stemme, G.
Author_Institution :
Dept. of Signals, Sensors & Syst., R. Inst. of Technol., Stockholm, Sweden
Volume :
2
fYear :
2003
Firstpage :
1832
Abstract :
This paper reports on a simple fabrication technique to create full wafer-level transferred glass-lid encapsulations for near-hermetic packaging of MEMS devices using adhesive wafer bonding with Benzocyclobutene. Furthermore, a new technique to create low-density feedthroughs through the glass wafer for electrical interconnections from the back to the front side of the glass-lids is introduced. The through-wafer vias are fabricated by combining a mechanical etch-step by powder-blasting from the back side and a subsequent short hydrofluoric acid wet etch step. The advantage of this via technique is that the major part of the via is etched without going completely through the wafer, allowing standard surface micromachining processes on the front side of the glass wafer before the final opening of the via.
Keywords :
adhesive bonding; encapsulation; glass; interconnections; micromachining; micromechanical devices; packaging; sputter etching; wafer bonding; MEMS devices; adhesive wafer bonding; benzocyclobutene; electrical interconnections; glass lid packages; hermetic packaging; hydrofluoric acid wet etching; powder-blasting; surface micromachining; wafer-level transferred glass-lid encapsulations; Encapsulation; Glass; Microelectromechanical devices; Micromachining; Micromechanical devices; Packaging; Surface contamination; Wafer bonding; Wafer scale integration; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
Type :
conf
DOI :
10.1109/SENSOR.2003.1217144
Filename :
1217144
Link To Document :
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