• DocumentCode
    1731280
  • Title

    Analytic analysis of 77 K CMOS minimum channel length

  • Author

    Abramczyk, Edward R. ; Meindl, James D.

  • Author_Institution
    Stanford Univ., CA, USA
  • fYear
    1989
  • Firstpage
    78
  • Lastpage
    82
  • Abstract
    The device limits for 77 K CMOS are calculated using a new analytic solution to Poisson´s equation. Symmetric complementary devices with n/sup +/ polysilicon gate n-channels and p/sup +/ polysilicon gate p-channels are modeled. Laplace´s equation in the gate oxide and Poissons´s equation in the silicon are solved with Dirichlet boundary conditions. The surface potential is rigorously derived by requiring continuity of the potential and normal component of the displacement field. The device channel length limit L/sub min/=74 nm at 77 K is calculated. Carrier freezeout is minimized by the resulting surface channel operation.<>
  • Keywords
    CMOS integrated circuits; cryogenics; integrated circuit technology; surface potential; 74 nm; 77 K; CMOS; Dirichlet boundary conditions; Laplace´s equation; Poisson´s equation; Poissons´s equation; Si-SiO/sub 2/; analytic solution; carrier freezeout; device channel length limit; device limits; displacement field; minimum channel length; n/sup +/ polysilicon gate n-channels; p/sup +/ polysilicon gate p-channels; potential continuity; surface channel operation; surface potential; Boundary conditions; Capacitors; Dielectric constant; Laplace equations; MOS devices; Physics; Poisson equations; Semiconductor device modeling; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Temperature Semiconductor Electronics, 1989., Proceedings of the Workshop on
  • Conference_Location
    Burlington, VT, USA
  • Type

    conf

  • DOI
    10.1109/LTSE.1989.50186
  • Filename
    50186