Ultrasensitive mode-localized micromechanical electrometer

We report a highly sensitive prototype micromechanical electrometer that employs the phenomena of mode-localization and curve veering for monitoring minute charge fluctuations across an input capacitor. The device consists of a pair of weakly coupled, nearly identical single crystal silicon, double-ended tuning fork (DETF) resonators. An addition of charge across an input capacitor on one of the coupled resonators induces a differential axial strain on that resonator relative to the other consequently perturbing the structural symmetry of the nearly periodic system. The resulting shifts in the eigenstates for the same magnitudes of charge input are theoretically and experimentally demonstrated to be nearly three orders of magnitude greater than corresponding resonant frequency variations. The topology chosen may also be adapted for force or strain monitoring thereby widening the relevance of the results reported here to precision inertial sensing as well.