DocumentCode :
1731557
Title :
Microwave induced upset of digital flight control systems
Author :
Clough, Bruce T. ; Cope, Brad ; Donley, Shawn
Author_Institution :
Wright Lab., US Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
1993
Firstpage :
179
Lastpage :
184
Abstract :
Recent tests of flight control system components show that digital flight control systems are vulnerable to microwave signals, but only at very high power levels, well above that produced by commercial radar installations. Test results of sensors, computers, data busses, and actuators reveal that long standing fears of inherent fly-by-wire flight control system vulnerability to microwave radiation are unfounded. Some components, such as sensors and data busses, aren´t affected at all. Others, such as the digital computers, fail at high power levels. The tests show that as long as the component shielding remains intact, component vulnerability is minimized. Good EMI design will give a harder system than simply relying on supposedly “EMI Proof” technologies, such as fiber optics. Testing revealed that inadequately designed fiber optic systems can actually reduce the system hardness to EMI. One conclusion is that the system shielding should be design controllable, that is, distributed between the airframe and component
Keywords :
actuators; aerospace computer control; aircraft control; aircraft instrumentation; detectors; electromagnetic interference; interference suppression; military equipment; radiation effects; radiation hardening (electronics); system buses; EMI; EMI design; actuators; component shielding; component vulnerability; data busses; digital computers; digital flight control; fiber optic systems; fly-by-wire flight control; microwave radiation effects; sensors; Actuators; Aerospace control; Electromagnetic interference; Microwave sensors; Optical design; Optical fiber testing; Optical fibers; Radar; Sensor systems; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 1993. 12th DASC., AIAA/IEEE
Conference_Location :
Fort Worth, TX
Print_ISBN :
0-7803-1343-7
Type :
conf
DOI :
10.1109/DASC.1993.283550
Filename :
283550
Link To Document :
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