DocumentCode :
1731573
Title :
Microwave induced upset of a digital flight control computer
Author :
Clough, Bruce T.
Author_Institution :
Wright Lab., US Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
1993
Firstpage :
173
Lastpage :
178
Abstract :
Tests have established upset levels for a set of digital flight control computers exposed to microwave radiation. Upsets occur for unprotected computers above 10 W/cm2 peak power over narrow frequency bands. The frequency range of upsets were from 1 to 4 GHz, no upsets were seen above these frequencies due to increased attenuation from circuit elements. Most vulnerable frequencies are at box resonance, which lie in the low single GHz for these types of avionics. Upset levels can be an order of magnitude lower at box resonance. The main point of entry of the microwave radiation is the I/O wire bundles. Box dimensions, wire runs, and internal board layout affect vulnerability. Almost all upsets seen were digital upsets. This is due to the very wide bandwidth of digital circuits being able to respond to narrow microwave pulses. The most important signal parameters to determine digital flight control computer upset potential are carrier frequency and peak power. Simple shielding techniques have the potential to eliminate any possible upsets seen
Keywords :
aerospace computer control; aircraft control; computer testing; digital control; electromagnetic interference; interference suppression; microwaves; radiation effects; radiation hardening (electronics); 1 to 4 GHz; EMI; I/O wire bundles; box dimensions; box resonance; carrier frequency; digital flight control computer; direct injection test; high power test; internal board layout; low power coupling; microwave pulses; microwave radiation; peak power; shielding; signal parameters; wire runs; Aerospace control; Aerospace electronics; Attenuation; Bandwidth; Digital circuits; Frequency; Pulse circuits; Resonance; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 1993. 12th DASC., AIAA/IEEE
Conference_Location :
Fort Worth, TX
Print_ISBN :
0-7803-1343-7
Type :
conf
DOI :
10.1109/DASC.1993.283551
Filename :
283551
Link To Document :
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