• DocumentCode
    1732036
  • Title

    A flexible method for including environmental toxicity in DFE and LCA

  • Author

    Hertwich, Edgar G. ; Sheng, Paul S. ; Koshland, Catherine P.

  • Author_Institution
    Energy & Resources Group, California Univ., Berkeley, CA, USA
  • fYear
    1996
  • Firstpage
    269
  • Lastpage
    274
  • Abstract
    The proposed toxic equivalency potential for SETAC Life-Cycle Assessment (LCA) relies on a data-intensive environmental fate and transport model, the fugacity model, and has rarely been applied. A case study of generic manufacturing processes showed that the toxic equivalency potential is applicable only for well-studied organic chemicals. This paper extends the applicability of toxic equivalency and introduces flexibility through allowing for other environmental pathway models. The evaluation utilizes a set of available information, including empirical data, environmental fate and transport models, and chemical similarity. A number of standard emissions streams from the electronics industry are compared and evaluated, using data from San Francisco Bay pollution studies, the CalTox model, and the EPA´s CFC phaseout program
  • Keywords
    design engineering; electronic equipment manufacture; electronics industry; manufacturing processes; pollution; CFC phaseout program; CalTox model; SETAC Life-Cycle Assessment; San Francisco Bay pollution studies; chemical similarity; design for environment; electronics industry; environmental fate and transport model; environmental pathway models; environmental toxicity; fugacity model; generic manufacturing processes; standard emissions streams; toxic equivalency potential; Electronics industry; Environmentally friendly manufacturing techniques; Global warming; Guidelines; Humans; Industrial pollution; Manufacturing processes; Mechanical engineering; Organic chemicals; Water pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and the Environment, 1996. ISEE-1996., Proceedings of the 1996 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-2950-3
  • Type

    conf

  • DOI
    10.1109/ISEE.1996.501890
  • Filename
    501890