Title :
Silicon-based wafer-level packaging for cost reduction of high brightness LEDs
Author :
Uhrmann, Thomas ; Matthias, Thorsten ; Lindner, Paul
Author_Institution :
EV Group, St. Florian am Inn, Austria
Abstract :
High brightness LEDs (HB-LEDs) carry a high prospect for general lighting applications. Competing with the cost/performance ratio of current light sources demands an increase of the overall efficiency as well as the reduction of the device cost. Since packaging accounts for 30%-50% of the cost of HB-LED manufacturing, moving from die-level to wafer-level processes is one likely potential solution for reducing cost per lumen. Silicon-based wafer-level-packaging (WLP), using the established processing technology of the MEMS and IC industry, offers high fabrication reliability, high yield and the direct integration of the driver IC in the package. The already small form factor of WLP can be further reduced using Through-Silicon-Vias (TSV), increasing the maximum amount of chips per wafer. Silicon WLP also offers superior thermal management, with the high thermal conductance of silicon. Redistributing LED dies on silicon wafer submounts, with metal bonding and copper TSVs, further improves the heat conductance away from the active region of the chip, resulting in increased device performance. Wafer-level optics can further improve performance and reduce packaging costs.
Keywords :
cost reduction; integrated circuit reliability; light emitting diodes; light sources; micromechanical devices; three-dimensional integrated circuits; wafer level packaging; HB-LED manufacturing; IC industry; MEMS; TSV; WLP; cost per lumen reduction; cost reduction; cost-performance ratio; current light source; high brightness LED; high fabrication reliability; silicon-based wafer-level packaging; Bonding; Coatings; Lenses; Light emitting diodes; Packaging; Phosphors; Silicon;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2011.5898728