• DocumentCode
    1732098
  • Title

    Performance analysis in chaotic-iteration-based ADCs

  • Author

    Shan, Xiuming ; Liu, Yulong ; Lin, Hao ; Ren, Yong

  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Abstract
    Chaos is an inherent property in the cyclic A/D conversion process. The principle has been extended to construct ´general cyclic ADCs´ based on chaotic iterations. The new attributes of the converters are also discussed. The analytic expressions of random error and system error in general cyclic ADCs are established and verified by simulations. With the same level of additive white noise, the optimal maps have been derived.
  • Keywords
    analogue-digital conversion; chaos; error analysis; additive white noise; chaotic iterations; chaotic-iteration-based ADCs; cyclic A/D conversion process; error model; general cyclic ADCs; optimal maps; performance analysis; random error; system error; Additive white noise; Binary codes; Buildings; Chaos; Clocks; Computer errors; Detectors; Performance analysis; Postal services; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
  • Print_ISBN
    0-7803-7448-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2002.1009860
  • Filename
    1009860