Title :
Generic face recognition, feature extraction and edge detection using optimal DSNR expansion matching
Author :
Rao, K. Raghava ; Ben-Arie, Jezekiel
Author_Institution :
Illinois Institute of Technology
Keywords :
Detectors; Face detection; Face recognition; Feature extraction; Image edge detection; Image recognition; Matched filters; Noise robustness; Quantum computing; Signal to noise ratio;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
