Title :
Correlation between electrical and mechanical properties of polymer composite
Author :
Vendik, I.B. ; Vendik, O.G. ; Afanasjev, V.P. ; Sokolova, I.M. ; Chigirev, D.A. ; Castro, R.A. ; Jansen, K.M.B. ; Ernst, L.J. ; Timmermans, P.
Author_Institution :
St. Petersburg Electrotech. Univ., St. Petersburg, Russia
Abstract :
The common features in dielectric and mechanical characteristics of the Epoxy Molding Compound (EMC) were found in temperature dependencies of the dielectric permittivity and the dielectric loss factor obtained in experiments by Electro-Dynamic Analysis (EDA) in comparison with the temperature dependence of storage modulus and mechanical loss factor in Dynamical Mechanical Analysis (DMA). Experimental results obtained give a basis for establishing a correlation between electrical and mechanical characteristics of the material. The relaxation model of the dynamic dielectric and mechanic response is suggested and verified by the experimental results. The same relaxation model has been used for a description of the frequency dependent storage modulus and inverse dielectric permittivity of the EMC sample. The temperature dependence of these parameters was introduced by the temperature dependent relaxation time model. The fitting parameters were found from the DMA and EDA experimental characteristics. A correct description of the mechanical and electrical characteristics of EMC samples in the glass transition temperature area has been obtained.
Keywords :
composite materials; dielectric losses; elastic moduli; electrodynamics; moulding; permittivity; polymers; resins; DMA; EDA; dielectric loss factor; dielectric permittivity; dynamic dielectric response; dynamic mechanic response; dynamical mechanical analysis; electrical properties; electrodynamic analysis; epoxy molding compound; frequency dependent storage modulus; inverse dielectric permittivity; mechanical loss factor; mechanical properties; polymer composite; temperature dependent relaxation time model; Dielectric losses; Electromagnetic compatibility; Materials; Permittivity; Temperature; Temperature dependence;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2011.5898740