DocumentCode :
1732605
Title :
Co-design of flip chip interconnection with anisotropic conductive adhesives and inkjet-printed circuits for paper-based RFID tags
Author :
Xie, Li ; Shen, Jue ; Mao, Jia ; Jonsson, Fredrik ; Zheng, Lirong
Author_Institution :
Sch. of Inf. & Commun. Technol., KTH (R. Inst. of Technol.), Stockholm-Kista, Sweden
fYear :
2011
Firstpage :
1752
Lastpage :
1757
Abstract :
In this paper we study the radio frequency performance of interconnect using anisotropic conductive film (ACF). A series of experiments are conducted in order to measure and model the electrical characteristics of inkjet-printed circuits on paper substrate as well as the impedance parameters of ACF interconnect at high frequency. Four-point measurement structure, time domain reflectometry (TDR), vector network analyzer (VNA) and de-embedded technology are used to ensure the accuracy of experiments. Equivalent circuit models are built based on the experimental results. Finally, these models are considered as parts of the matching network and circuit design for the RFID receiver, which can be co-designed for developing paper-based electronic systems. It is found that since the difference between RFID tags with and without ACF interconnects is negligible, the influence of ACF interconnects can be ignored for paper-based UHF RFID tag. ACF is a feasible interconnect material for paper-based RFID tags.
Keywords :
flip-chip devices; radiofrequency identification; ACF interconnect; RFID receiver; anisotropic conductive adhesives; anisotropic conductive film; circuit design; de-embedded technology; electrical characteristics; equivalent circuit model; flip chip interconnection codesign; four-point measurement structure; impedance parameter; inkjet-printed circuit; interconnect material; matching network; paper substrate; paper-based UHF RFID tag; paper-based electronic system; radio frequency performance; time domain reflectometry; vector network analyzer; Electrical resistance measurement; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Radiofrequency identification; Substrates; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898749
Filename :
5898749
Link To Document :
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