• DocumentCode
    1732692
  • Title

    Pre-testing Flash Device Driver through Model Checking Techniques

  • Author

    Kim, Moonzoo ; Kim, Yunho ; Choi, Yunja ; Kim, Hotae

  • Author_Institution
    Dept. of CS, Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2008
  • Firstpage
    475
  • Lastpage
    484
  • Abstract
    Flash memory has become virtually indispensable in most mobile devices, such as mobile phones, digital cameras, mp3 players, etc. In order for mobile devices to successfully provide services, it is essential that flash memory be controlled correctly through the device driver software. However, as is typical for embedded software, conventional testing methods often fail to detect hidden flaws in the complex device driver software. This deficiency incurs significant development and operation overhead to the manufacturers. As a complementary approach to improve the reliability of embedded software, model checking provides a complete analysis of a target model but the size of the target software is limited due to the state explosion problem. In this project, we have verified the correctness of a multi-sector read operation of Samsung OneNANDTM flash device driver by using both model checking and testing. We started the verification task with the model checkers NuSMV and Spin for an exhaustive analysis of a small size flash as a pre-testing step. We then set up a testbed based on a formal model used for model checking and performed testing on a large size flash. Through these verification tasks, we could successfully verify the correctness of the multi-sector read operation with both complete exploration of model checking and scalability of testing.
  • Keywords
    device drivers; embedded systems; flash memories; program testing; program verification; software reliability; NuSMV model checker; Samsung OneNAND flash device driver software pre-testing; Spin model checker; correctness verification; embedded software reliability; flash memory; multisector read operation; state explosion problem; Digital cameras; Driver circuits; Embedded software; Explosions; Flash memory; Laboratories; Manufacturing; Mobile handsets; Scalability; Software testing; Embedded Software; Model Checking; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification, and Validation, 2008 1st International Conference on
  • Conference_Location
    Lillehammer
  • Print_ISBN
    978-0-7695-3127-4
  • Type

    conf

  • DOI
    10.1109/ICST.2008.55
  • Filename
    4539576