DocumentCode :
1732734
Title :
Anisotropic conductive adhesive films for flip-chip interconnection onto organic substrates
Author :
Nagai, Akira ; Takemura, Kenzo ; Isaka, Kazuhiro ; Watanabe, Osamu ; Kojima, Kazuyoshi ; Matsuda, Kazuya ; Watanabe, Ltsuo
Author_Institution :
Tsukuba Res. Lab., Hitachi Chem. Co. Ltd., Ibaraki, Japan
fYear :
1998
Firstpage :
353
Lastpage :
357
Abstract :
We have developed new anisotropic conductive adhesive films (ACFs) for flip-chip interconnection to organic substrates such as printed wiring boards (PWBs). In order to reduce thermal and mechanical stress and strain induced by CTE (coefficient of thermal expansion) mismatches between chip and organic substrate, the elastic modulus of the ACF adhesive resin was lowered. In addition, the ACF adhesion strength was enhanced by optimizing the adhesive resin formulation. As a result, the modified ACF in flip-chip interconnection between gold bumps of a chip and Ni/Au coated pads on an FR-4 PWB shows stable contact resistance of lower than 10 m/spl Omega/ even after exposure to various environmental tests such as a thermal cycling test (-55/spl deg/C/+125/spl deg/C, 1000 cycles) and a pressure cooker test (121/spl deg/C, 2 atm, 168 hr) following an IR reflow treatment (twice). In addition, the excellent connection reliability was confirmed by in-situ measurement of contact resistance on a thermal cycling test (-55/spl deg/C/+125/spl deg/C, 1,000 cycles) and a high temperature humidity test (85/spl deg/C/85%RH, 1,000 hr) following IR reflow treatment (twice).
Keywords :
adhesives; assembling; conducting polymers; contact resistance; elastic moduli; flip-chip devices; humidity; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; internal stresses; polymer films; reflow soldering; thermal expansion; thermal stresses; -55 to 125 C; 1000 hr; 121 C; 168 hr; 2 atm; 85 C; ACF adhesion strength; ACF adhesive resin; ACFs; Au-Ni-Au; CTE induced strain; CTE mismatch; FR-4 PWB; IR reflow treatment; Ni/Au coated pads; adhesive resin formulation optimization; anisotropic conductive adhesive films; coefficient of thermal expansion; connection reliability; elastic modulus; environmental tests; flip-chip interconnection; gold bumps; in-situ contact resistance measurement; mechanical stress; modified ACF; organic substrates; pressure cooker test; printed wiring boards; stable contact resistance; temperature humidity test; thermal cycling test; thermal stress; Anisotropic conductive films; Anisotropic magnetoresistance; Conductive adhesives; Contact resistance; Gold; Resins; Testing; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEMT/IMC Symposium, 2nd 1998
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-5090-1
Type :
conf
DOI :
10.1109/IEMTIM.1998.704675
Filename :
704675
Link To Document :
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