Title :
A 10-bit 1 MS/s 3-step ADC with bitstream-based sub-DAC and sub-ADC calibration
Author :
Pishdad, B. ; Roberts, G.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
fDate :
6/24/1905 12:00:00 AM
Abstract :
A 3-step Nyquist-rate ADC is presented which makes use of bitstream techniques to design and calibrate the D/A subconverter, while using the same hardware to calibrate the A/D subconverter. The novel methods presented remove the dependence on offsets and component mismatches in the D/A subconverter. They eliminate the need for a reference ladder in the A/D subconverter and calibrate comparator offsets. In addition, DC offsets in the residue amplifier are calibrated. Simulation results of a prototype in 0.18 μ CMOS technology show 10 bits of resolution at an operating speed of 1 MS/s.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; 0.18 micron; 10 bit; A/D subconverter; CMOS technology; D/A subconverter; DC offset; amplifier; bitstream processing; calibration; comparator; component mismatch; design; three-step Nyquist-rate analog-to-digital converter; CMOS technology; Calibration; Circuits; DC generators; Frequency; Hardware; Low pass filters; Pulse modulation; Virtual prototyping; Voltage;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009887
