DocumentCode :
1732939
Title :
Welcome message
fYear :
2008
Firstpage :
1
Lastpage :
1
Abstract :
Presents the introductory welcome message from the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-2402-3
Type :
conf
DOI :
10.1109/TEST.2008.4700532
Filename :
4700532
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1732939
