• DocumentCode
    173296
  • Title

    Considering variation and aging in a full chip design methodology at system level

  • Author

    Helms, Domenik ; Gruttner, Kim ; Eilers, Reef ; Metzdorf, Malte ; Hylla, Kai ; Poppen, F. ; Nebel, Wolfgang

  • Author_Institution
    OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
  • fYear
    2014
  • fDate
    May 31 2014-June 1 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We present a new system-level design methodology enabling the consideration of process variations and degradation due to aging in early stages of the design process. By mapping an executable system specification to SoC processing, communication and memory components in combination with component wise timing and power characterization with a source-level back-annotation, we enable efficient full SoC power and temperature over time simulations. Based on the resulting temporal and spatial power and temperature distribution we use a high-level multi-physics simulation to assess the impact of degradation and aging. We evaluate our approach using an ARM7 based SoC design.
  • Keywords
    ageing; system-on-chip; temperature distribution; ARM7 based SoC design; aging; communication components; component wise timing; full chip design; high-level multiphysics simulation; memory components; power characterization; process variations; source-level back-annotation; spatial power; system-level design; temperature distribution; temporal power; Aging; Computational modeling; Degradation; System-on-chip; Threshold voltage; Timing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System Level Synthesis Conference (ESLsyn), Proceedings of the 2014
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    979-10-92279-00-9
  • Type

    conf

  • DOI
    10.1109/ESLsyn.2014.6850386
  • Filename
    6850386