Managing Test in the End-to-End, Mega Supply Chain

Today\´s "connected" environment has created significant growth opportunities in the electronics industry. Products have never been sodiverse, ranging from phones that can play movies and give directions to the nearest Starbucks to "super routers" that can move terabits worth of data around the world instantly. It is now possible to access the internet almost anywhere, including "emerging" areas which once had little to no contact at all with the rest of the world. This growth in opportunities has spurred significant supply chain growth with significant growth in both consumers and suppliers. The challenges for today\´s supply chain have also grown significantly with much greater diversity in products; increasing customer requirements (lower cost, faster deliver, better quality andfastertimeto market); smaller, denser, faster and more complex technology and a supply chain that now consists of thousands of suppliers and thousands of customers all over the world. All of this with a totally "virtual", global supply chain. Mike Lydon will highlight these challenges and discuss how test, and the data produced by test can either enable or disrupt these virtual supply chains. He will talk about communication in the virtual supply chain and how test can enable real time, end-to-end adjustments over the product lifecycle. Mike will conclude by presenting his vision of the test and data managed, optimized, end-to-end, global, virtual supply chain.