DocumentCode
1733161
Title
Having FUN with Analog Test
Author
Pease, R.A.
fYear
2008
Firstpage
14
Lastpage
14
Abstract
Summary form only given. Bob Pease is a legend in the analog design community. Bob has designed analog circuits for over 48 years, including 25 linear ICs and dozens of op amps and discrete circuits. As a designer for 48 years, Bob understands the importance of test engineers, test plans and test design. He also understands the implications of not getting the test done right. Bob shares the good, the bad and the ugly test experiences he´s had over the years . Bob also answers pre-submitted questions during the session, making this the first interactive, invited talk in ITC history.
Keywords
analogue circuits; circuit testing; operational amplifiers; analog circuits; analog design; analog test; discrete circuits; linear IC; op amps; Analog circuits; Analog computers; Circuit testing; Design engineering; History; Indium tin oxide; Operational amplifiers; Regulators; Semiconductor device testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700542
Filename
4700542
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