• DocumentCode
    1733161
  • Title

    Having FUN with Analog Test

  • Author

    Pease, R.A.

  • fYear
    2008
  • Firstpage
    14
  • Lastpage
    14
  • Abstract
    Summary form only given. Bob Pease is a legend in the analog design community. Bob has designed analog circuits for over 48 years, including 25 linear ICs and dozens of op amps and discrete circuits. As a designer for 48 years, Bob understands the importance of test engineers, test plans and test design. He also understands the implications of not getting the test done right. Bob shares the good, the bad and the ugly test experiences he´s had over the years . Bob also answers pre-submitted questions during the session, making this the first interactive, invited talk in ITC history.
  • Keywords
    analogue circuits; circuit testing; operational amplifiers; analog circuits; analog design; analog test; discrete circuits; linear IC; op amps; Analog circuits; Analog computers; Circuit testing; Design engineering; History; Indium tin oxide; Operational amplifiers; Regulators; Semiconductor device testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700542
  • Filename
    4700542