DocumentCode
1733200
Title
TTTC: Test Technology Technical Council
fYear
2008
Firstpage
16
Lastpage
18
Abstract
Provides a listing of current committee members and society officers.
Keywords
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Type
conf
DOI
10.1109/TEST.2008.4700544
Filename
4700544
Link To Document