DocumentCode
1733361
Title
Unraveling Variability for Process/Product Improvement
Author
Gattiker, Anne
Author_Institution
IBM Res. Div, Austin Res. Lab., Austin, TX
fYear
2008
Firstpage
1
Lastpage
9
Abstract
Manufacturing process variability compromises design aggressiveness, yield and system-level power-performance. This paper presents strategies for unraveling variability to understand its sources so that appropriate corrective action can be applied. The strategies are applied to data representing operation of finished electronic circuits, including product test results on real product hardware.
Keywords
data structures; electronics industry; finishing; product design; data representing operation; electronic circuits; manufacturing process variability; process-product improvement; real product hardware; system-level power-performance; Circuit synthesis; Circuit testing; Electric breakdown; Electronic circuits; Electronic equipment testing; Etching; Hardware; Manufacturing processes; Process design; Ring oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700550
Filename
4700550
Link To Document