Title :
Unraveling Variability for Process/Product Improvement
Author_Institution :
IBM Res. Div, Austin Res. Lab., Austin, TX
Abstract :
Manufacturing process variability compromises design aggressiveness, yield and system-level power-performance. This paper presents strategies for unraveling variability to understand its sources so that appropriate corrective action can be applied. The strategies are applied to data representing operation of finished electronic circuits, including product test results on real product hardware.
Keywords :
data structures; electronics industry; finishing; product design; data representing operation; electronic circuits; manufacturing process variability; process-product improvement; real product hardware; system-level power-performance; Circuit synthesis; Circuit testing; Electric breakdown; Electronic circuits; Electronic equipment testing; Etching; Hardware; Manufacturing processes; Process design; Ring oscillators;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700550
